GenAU: Language-Grounded Industrial Anomaly Understanding with Vision-Language Models
Industrial inspection requires more than binary anomaly detection: a practical system should determine whether an anomaly exists, localize the defective region, identify the defect type, and provide interpretable visual evidence. Existing CLIP-based methods detect and localize anomalies well but offer limited language-level defect understanding, while instruction-tuned vision-language models can describe defects but do not natively produce pixel-level masks. We introduce GenAU, a Generalist vision-language framework for industrial Anomaly Understanding that unifies image-level detection, pixel
